| /external/libffi/testsuite/libffi.special/ |
| H A D | unwindtest_ffi_call.cc | 10 static int checking(int a __UNUSED__, short b __UNUSED__, argument
11 signed char c __UNUSED__)
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| H A D | ffitestcxx.h | 10 /* Define __UNUSED__ that also other compilers than gcc can run the tests. */
11 #undef __UNUSED__ macro
13 #define __UNUSED__ __attribute__((__unused__)) macro
15 #define __UNUSED__ macro
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| H A D | unwindtest.cc | 11 closure_test_fn(ffi_cif* cif __UNUSED__, void* resp __UNUSED__, argument
12 void** args __UNUSED__, void* userdata __UNUSED__)
19 void closure_test_fn1(ffi_cif* cif __UNUSED__, void* resp, argument
20 void** args, void* userdata __UNUSED__)
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| /external/libffi/testsuite/libffi.call/ |
| H A D | closure_fn0.c | 16 closure_test_fn0(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
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| H A D | closure_fn1.c | 13 static void closure_test_fn1(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
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| H A D | closure_fn2.c | 12 static void closure_test_fn2(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
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| H A D | closure_fn3.c | 12 static void closure_test_fn3(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
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| H A D | closure_fn4.c | 14 closure_test_fn0(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
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| H A D | closure_fn5.c | 13 closure_test_fn5(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
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| H A D | closure_fn6.c | 12 closure_test_fn0(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
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| H A D | closure_stdcall.c | 11 closure_test_stdcall(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
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| H A D | cls_double.c | 10 static void cls_ret_double_fn(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
11 void* userdata __UNUSED__)
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| H A D | cls_float.c | 10 static void cls_ret_float_fn(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
11 void* userdata __UNUSED__)
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| H A D | cls_schar.c | 12 static void cls_ret_schar_fn(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
13 void* userdata __UNUSED__)
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| H A D | cls_sint.c | 10 static void cls_ret_sint_fn(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
11 void* userdata __UNUSED__)
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| H A D | cls_sshort.c | 10 static void cls_ret_sshort_fn(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
11 void* userdata __UNUSED__)
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| H A D | cls_uchar.c | 10 static void cls_ret_uchar_fn(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
11 void* userdata __UNUSED__)
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| H A D | cls_uint.c | 10 static void cls_ret_uint_fn(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
11 void* userdata __UNUSED__)
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| H A D | cls_ulonglong.c | 10 static void cls_ret_ulonglong_fn(ffi_cif* cif __UNUSED__, void* resp, argument
11 void** args, void* userdata __UNUSED__)
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| H A D | cls_ushort.c | 10 static void cls_ret_ushort_fn(ffi_cif* cif __UNUSED__, void* resp, void** args, argument
11 void* userdata __UNUSED__)
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| H A D | ffitest.h | 12 /* Define __UNUSED__ that also other compilers than gcc can run the tests. */
13 #undef __UNUSED__ macro
15 #define __UNUSED__ __attribute__((__unused__)) macro
17 #define __UNUSED__ macro
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| H A D | cls_multi_schar.c | 22 static void test_func_gn(ffi_cif *cif __UNUSED__, void *rval, void **avals, argument
23 void *data __UNUSED__)
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| H A D | cls_multi_sshort.c | 22 static void test_func_gn(ffi_cif *cif __UNUSED__, void *rval, void **avals, argument
23 void *data __UNUSED__)
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| H A D | cls_multi_ushort.c | 22 static void test_func_gn(ffi_cif *cif __UNUSED__, void *rval, void **avals, argument
23 void *data __UNUSED__)
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| H A D | cls_12byte.c | 31 static void cls_struct_12byte_gn(ffi_cif* cif __UNUSED__, void* resp, argument
32 void** args , void* userdata __UNUSED__)
|