| /hardware/intel/common/libva/test/basic/ |
| H A D | test_01.c | 37 void test() function
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| H A D | test_02.c | 34 void test() function
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| H A D | test_03.c | 35 void test() function
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| H A D | test_04.c | 37 void test() function
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| H A D | test_05.c | 35 void test() function
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| H A D | test_07.c | 53 void test() function
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| H A D | test_06.c | 68 void test() function
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| H A D | test_08.c | 66 void test() function
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| H A D | test_09.c | 35 void test() function
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| H A D | test_10.c | 103 void test() function
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| H A D | test_11.c | 103 void test() function
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| H A D | test_vaSurfaceAttrib.c | 35 void test() function
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| /hardware/interfaces/audio/2.0/vts/functional/utility/ |
| H A D | ValidateXml.h | 25 namespace test { namespace in namespace:android::hardware::audio
37 /** Helper gtest ASSERT to test xml validity against an xsd. */
39 ASSERT_PRED_FORMAT2(::android::hardware::audio::test::validateXml, \
42 } // namespace test
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| H A D | ValidateXml.cpp | 33 namespace test { namespace in namespace:android::hardware::audio
138 } // namespace test
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| /hardware/qcom/media/msm8974/mm-video-legacy/vidc/ |
| H A D | vdec.mk | 89 # Make the apps-test (mm-vdec-omx-test)
93 mm-vdec-test-inc := hardware/qcom/media/msm8974/mm-core/inc
94 mm-vdec-test-inc += $(LOCAL_PATH)/vdec/inc
96 LOCAL_MODULE := mm-vdec-omx-test
99 LOCAL_C_INCLUDES := $(mm-vdec-test-inc)
104 LOCAL_SRC_FILES += vdec/test/omx_vdec_test.cpp
109 # Make the driver-test (mm-video-driver-test)
113 mm-vdec-drv-test
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| /hardware/qcom/media/msm8974/mm-video-v4l2/vidc/ |
| H A D | vdec.mk | 180 # Make the apps-test (mm-vdec-omx-test)
184 mm-vdec-test-inc := hardware/qcom/media/msm8974/mm-core/inc
185 mm-vdec-test-inc += $(LOCAL_PATH)/vdec/inc
186 mm-vdec-test-inc += $(vdec-inc)
188 LOCAL_MODULE := mm-vdec-omx-test
191 LOCAL_C_INCLUDES := $(mm-vdec-test-inc)
196 LOCAL_SRC_FILES += vdec/test/omx_vdec_test.cpp
201 # Make the driver-test (mm-video-driver-test)
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| /hardware/libhardware/modules/sensors/dynamic_sensor/test/ |
| H A D | HidRawDeviceTest.cpp | 30 * Host test that verifies HidRawDevice and HidRawSensor works correctly.
34 static void test(const char *devicePath) { function in class:android::SensorHalExt::HidRawDeviceTest
123 android::SensorHalExt::HidRawDeviceTest::test(argv[1]);
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| H A D | HidRawSensorTest.cpp | 110 static bool test() { function in class:android::SensorHalExt::HidRawSensorTest
161 return android::SensorHalExt::HidRawSensorTest::test() ? 0 : 1;
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| /hardware/interfaces/gnss/1.0/vts/functional/ |
| H A D | VtsHalGnssV1_0TargetTest.cpp | 40 // for command line argument on how strictly to run the test
44 // The main test class for GNSS HAL.
102 /* Used as a mechanism to inform the test that a callback has occurred */
150 // Actual (test) callback handlers
181 * test.)
281 bool StartAndGetSingleLocation(GnssHalTest* test, bool checkAccuracies) { argument
282 auto result = test->gnss_hal_->start();
288 * GPS signals initially optional for this test, so don't expect fast fix,
297 test->wait(firstGnssLocationTimeoutSeconds);
299 EXPECT_EQ(test
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| /hardware/invensense/6515/libsensors_iio/software/simple_apps/devnode_parser/ |
| H A D | iio_utils.h | 439 int test; local
464 fscanf(sysfsfp, "%d", &test);
467 printf("VERB: cat %s = %d\n", temp, test);
468 if (test != val) {
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| /hardware/invensense/6515/libsensors_iio/software/simple_apps/mpu_iio/ |
| H A D | iio_utils.h | 439 int test; local
464 fscanf(sysfsfp, "%d", &test);
467 printf("VERB: cat %s = %d\n", temp, test);
468 if (test != val) {
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| /hardware/invensense/6515/libsensors_iio/software/simple_apps/stress_iio/ |
| H A D | iio_utils.h | 438 int test; local
464 fscanf(sysfsfp, "%d", &test);
465 if (test != val) {
494 int test; local
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| /hardware/qcom/audio/legacy/alsa_sound/ |
| H A D | AudioUsbALSA.cpp | 101 *ratesStrStart, *chString, *nextSRStr, *test, *nextSRString, *temp_ptr; local
784 const char *fn = "/data/test.pcm";
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| /hardware/interfaces/audio/2.0/vts/functional/ |
| H A D | AudioPrimaryHidlHalTest.cpp | 91 /** Document the current test case.
92 * Eg: calling `doc::test("Dump the state of the hal")` in the "debugDump" test
100 void test(const std::string& testCaseDocumentation) { function in namespace:doc
104 /** Document why a test was not fully run. Usually due to an optional feature
111 /** Add a note to the test. */
167 // Cache the devicesFactory retrieval to speed up each test by ~0.5s
173 doc::test("test the getService (called in SetUp)");
177 doc::test("tes
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| /hardware/interfaces/keymaster/3.0/vts/functional/ |
| H A D | keymaster_hidl_hal_test.cpp | 44 // This service_name will be passed to getService when retrieving the keymaster service to test. To
191 namespace test { namespace in namespace:android::hardware::keymaster::V3_0
395 // SetUpTestCase runs only once per test case, not once per test.
1258 // To keep this test from being very slow, we only test a random fraction of non-byte
1259 // key sizes. We test only ~10% of such cases. Since there are 392 of them, we expect
1283 * test is probabilistic in order to keep the runtime down, but any failure prints out the specific
1289 // To keep this test from being very long, we only test
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