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27-Sep-2016 |
Pierre Langlois <pierre.langlois@arm.com> |
[tests] Allow generating one description to support two ISA
This patch changes the naming scheme of the generated tests, so we can
support generating both a A32 and T32 test for a single
description. This is a pre-requisite to tests NEON/VFP instructions, as
they very often have the same constraints in both ISAs.
The name of the ISA is now placed at the end of each tests. A
configuration file which does not specify an ISA will see its test files
duplicated for both.
Finally, the "rd-rn-rm-{a32,t32}.json" configurations where identical
apart from the ISA. This patch shares them.
Change-Id: Icd89112b94dd135b7519b6c65fade17fe3b8e217
/external/vixl/test/aarch32/test-assembler-cond-rd-operand-rn-low-registers-in-it-block-t32.cc
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