d1bf2784420717dcd20888a6eaecb18ab7f01d56 |
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27-Sep-2016 |
Pierre Langlois <pierre.langlois@arm.com> |
[tests] Allow generating one description to support two ISA This patch changes the naming scheme of the generated tests, so we can support generating both a A32 and T32 test for a single description. This is a pre-requisite to tests NEON/VFP instructions, as they very often have the same constraints in both ISAs. The name of the ISA is now placed at the end of each tests. A configuration file which does not specify an ISA will see its test files duplicated for both. Finally, the "rd-rn-rm-{a32,t32}.json" configurations where identical apart from the ISA. This patch shares them. Change-Id: Icd89112b94dd135b7519b6c65fade17fe3b8e217
/external/vixl/test/aarch32/test-assembler-cond-rdlow-rnlow-rmlow-in-it-block-t32.cc
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