Searched defs:test (Results 1 - 25 of 51) sorted by relevance

123

/drivers/staging/speakup/
H A Dspeakup_audptr.c146 unsigned char test = 0; local
149 synth_id[test] = spk_serial_in();
150 if (synth_id[test] == 'A') {
153 synth_id[++test] = spk_serial_in();
154 } while (synth_id[test] != '\n' && test < 32);
155 synth_id[++test] = 0x00;
/drivers/usb/musb/
H A Dmusb_debugfs.c143 unsigned test; local
145 test = musb_readb(musb->mregs, MUSB_TESTMODE);
147 if (test & MUSB_TEST_FORCE_HOST)
150 if (test & MUSB_TEST_FIFO_ACCESS)
153 if (test & MUSB_TEST_FORCE_FS)
156 if (test & MUSB_TEST_FORCE_HS)
159 if (test & MUSB_TEST_PACKET)
160 seq_printf(s, "test packet\n");
162 if (test & MUSB_TEST_K)
163 seq_printf(s, "test
191 u8 test = 0; local
[all...]
/drivers/mtd/maps/
H A Dbfin-async-flash.c74 map_word test; local
82 test.x[0] = word;
83 return test;
H A Dgpio-addr-flash.c86 map_word test; local
91 test.x[0] = word;
92 return test;
/drivers/i2c/busses/
H A Di2c-iop3xx.c161 typedef int (* compare_func)(unsigned test, unsigned mask);
198 all_bits_clear(unsigned test, unsigned mask) argument
200 return (test & mask) == 0;
204 any_bits_set(unsigned test, unsigned mask) argument
206 return (test & mask) != 0;
/drivers/isdn/hardware/eicon/
H A Dos_bri.c636 dword i, test; local
691 test = (dword) inppw(ioaddr);
692 if (test == 0x4447) {
705 test))
730 ("A: A(%d) interrupt test failed",
/drivers/macintosh/
H A Dmacio-adb.c35 struct preg test; member in struct:adb_regs
/drivers/net/can/c_can/
H A Dc_can.h45 u16 test; member in struct:c_can_regs
/drivers/pci/hotplug/
H A Dpci_hotplug_core.c242 u32 test; local
246 test = (u32)(ltest & 0xffffffff);
247 dbg ("test = %d\n", test);
254 retval = slot->ops->hardware_test(slot, test);
264 .attr = {.name = "test", .mode = S_IFREG | S_IRUGO | S_IWUSR},
/drivers/vhost/
H A Dtest.c6 * test virtio server in host kernel.
20 #include "test.h"
166 static long vhost_test_run(struct vhost_test *n, int test) argument
172 if (test < 0 || test > 1)
191 priv = test ? n : NULL;
255 int test; local
260 if (copy_from_user(&test, argp, sizeof test))
262 return vhost_test_run(n, test);
[all...]
/drivers/firmware/
H A Dedd.c66 int (*test) (struct edd_device * edev); member in struct:edd_attribute
79 .test = _test, \
706 if (!attr->test ||
707 (attr->test && attr->test(edev)))
/drivers/media/radio/
H A Dradio-cadet.c145 unsigned freq = 0, test, fifo = 0; local
156 test = 12500;
159 freq += test;
160 test = test << 1;
175 unsigned test; local
183 test = 0;
184 test = (fifo >> 23) & 0x02; /* Align data for SDO */
185 test |= 0x1c; /* SDM=1, SWE=1, SEN=1, SCK=0 */
187 outb(test, de
203 int i, j, test; local
[all...]
/drivers/net/ethernet/intel/ixgbevf/
H A Dethtool.c88 "Register test (offline)",
89 "Link test (on/offline)"
483 /* ethtool register test data */
509 /* default VF register test */
537 "pattern test reg %04X failed: got " \
555 pr_err("set/check reg %04X test failed: got 0x%08X expected " \
566 const struct ixgbevf_reg_test *test; local
569 test = reg_test_vf;
572 * Perform the register test, looping through the test tabl
[all...]
/drivers/staging/iio/Documentation/
H A Diio_utils.h494 int test; local
514 fscanf(sysfsfp, "%d", &test);
515 if (test != val) {
/drivers/media/video/
H A Dmsp3400-driver.c125 struct i2c_msg test[2] = { local
133 i2c_transfer(client->adapter, test, 2) != 2) {
/drivers/net/ethernet/emulex/benet/
H A Dbe_ethtool.c162 "MAC Loopback test",
163 "PHY Loopback test",
164 "External Loopback test",
165 "DDR DMA test",
166 "Link test"
682 be_self_test(struct net_device *netdev, struct ethtool_test *test, u64 *data) argument
690 if (test->flags & ETH_TEST_FL_OFFLINE) {
693 test->flags |= ETH_TEST_FL_FAILED;
697 test->flags |= ETH_TEST_FL_FAILED;
701 test
[all...]
/drivers/net/wireless/ath/ath9k/
H A Deeprom_4k.c653 u8 powerLimit, bool test)
685 if (test)
649 ath9k_hw_4k_set_txpower(struct ath_hw *ah, struct ath9k_channel *chan, u16 cfgCtl, u8 twiceAntennaReduction, u8 powerLimit, bool test) argument
H A Deeprom_9287.c676 * Compare test group from regulatory channel list
677 * with test mode from pCtlMode list
796 u8 powerLimit, bool test)
829 if (test)
793 ath9k_hw_ar9287_set_txpower(struct ath_hw *ah, struct ath9k_channel *chan, u16 cfgCtl, u8 twiceAntennaReduction, u8 powerLimit, bool test) argument
H A Deeprom_def.c1233 u8 powerLimit, bool test)
1281 if (test)
1229 ath9k_hw_def_set_txpower(struct ath_hw *ah, struct ath9k_channel *chan, u16 cfgCtl, u8 twiceAntennaReduction, u8 powerLimit, bool test) argument
/drivers/block/
H A Dxd.c999 u_short min[] = { 0,0,0 },max[] = { 16,1024,64 },test[] = { 0,0,0 }; local
1007 test[i] = (min[i] + max[i]) / 2;
1008 xd_build(cmdblk,CMD_SEEK,drive,(u_char) test[0],(u_short) test[1],(u_char) test[2],0,0);
1010 min[i] = test[i];
1012 max[i] = test[i];
1014 test[i] = min[i];
/drivers/net/ethernet/intel/e1000/
H A De1000_ethtool.c103 "Register test (offline)", "Eeprom test (offline)",
104 "Interrupt test (offline)", "Loopback test (offline)",
105 "Link test (on/offline)"
642 static const u32 test[] = local
648 for (i = 0; i < ARRAY_SIZE(test); i++) {
649 writel(write & test[i], address);
651 if (read != (write & test[i] & mask)) {
652 e_err(drv, "pattern test re
[all...]
/drivers/net/ethernet/intel/e1000e/
H A Dethtool.c116 "Register test (offline)", "Eeprom test (offline)",
117 "Interrupt test (offline)", "Loopback test (offline)",
118 "Link test (on/offline)"
724 static const u32 test[] = { local
726 for (pat = 0; pat < ARRAY_SIZE(test); pat++) {
728 (test[pat] & write));
730 if (val != (test[pat] & write & mask)) {
731 e_err("pattern test re
[all...]
/drivers/net/ethernet/intel/igb/
H A Digb_ethtool.c131 "Register test (offline)", "Eeprom test (offline)",
132 "Interrupt test (offline)", "Loopback test (offline)",
133 "Link test (on/offline)"
827 /* ethtool register test data */
854 /* i350 reg test */
866 /* RDH is read-only for i350, only test RDT. */
897 /* 82580 reg test */
909 /* RDH is read-only for 82580, only test RD
1067 struct igb_reg_test *test; local
[all...]
/drivers/net/ethernet/sfc/
H A Dethtool.c281 * efx_fill_test - fill in an individual self-test entry
282 * @test_index: Index of the test
284 * @data: Ethtool test results, or %NULL
285 * @test: Pointer to test result (used only if data != %NULL)
291 * Fill in an individual self-test entry.
295 int *test, const char *unit_format, int unit_id,
302 data[test_index] = *test;
326 * efx_fill_loopback_test - fill in a block of loopback self-test entries
328 * @lb_tests: Efx loopback self-test result
293 efx_fill_test(unsigned int test_index, struct ethtool_string *strings, u64 *data, int *test, const char *unit_format, int unit_id, const char *test_format, const char *test_id) argument
520 efx_ethtool_self_test(struct net_device *net_dev, struct ethtool_test *test, u64 *data) argument
[all...]
H A Dtxc43128_phy.c140 /* BIST type (controls bit patter in test) */
155 /* Mt. Diablo test configuration */
208 static int txc_bist_one(struct efx_nic *efx, int mmd, int test) argument
214 /* Set PMA to test into loopback using Mt Diablo reg as per app note */
221 bctl = (test << TXC_BIST_CTRL_TYPE_LBN);

Completed in 843 milliseconds

123